Silicon Drift Detectors (SDD) for Beam-line Applications

SINGLE & MULTI-ELEMENT SILICON DRIFT DETECTORS (SDD) FOR BEAM-LINE APPLICATIONS

RaySpec offers a unique range of SDD products for beamline applications at synchrotrons and particle accelerators, designed for all fluorescence spectroscopy applications.

7 x 65mm2 SDD – Focused Array
13-sensor focused SDD detector

All beam-lines are different, especially in today’s environment of multi-technique end stations. Space is more and more limited and the requirements of the detectors are increasingly specialised.

For these reasons, most of the Silicon Drift Detectors that RaySpec builds for beamline/research applications are specially adapted at various levels. Sensor geometries relative to the target are most important and RaySpec offers complete customisation in this respect from single to multiple sensors in planar or focused arrays with specially designed relative sensor positions. All other mechanical features are designed in close cooperation with our customers to produce a unique solution for each experimental station and application.

Other important features may include additional collimation and the selection of detector materials to reduce the effects of scattered and secondary fluorescence x-rays. RaySpec will work with end station designers to achieve the best solution.

RaySpec detectors are available with the latest low-capacitance ASIC (CUBE) primary amplification devices which enable the detector to operate with improved resolutions at very short peaking times – a desirable feature for synchrotron applications where high count rate capability is an important requirement.

4-sensor focused vertical array

RaySpec Silicon Drift Detectors can be customised by

100mm² SDD with slide and vacuum flange

The RaySpec design team will work with the customer and their team to ensure the design is optimised for their application, to guarantee the installation will be seamless and that the end result will be complete satisfaction.

Typical beamline applications include:

  • X-Ray Fluorescence (XRF)
  • Micro- and nano- X-Ray Fluorescence (µXRF and nXRF)
  • Total Reflection X-Ray Fluorescence (TXRF)
  • X-Ray Absorption Spectroscopy (XAS)
  • Particle Induced X-Ray Emission (PIXE)

SDD Detector options for Beam-line applications

For a complete list of design options and examples, the following brochures are available to download

RaySpec Single and Multi-Sensor SDD for Beam-line ApplicationsAdobe_PDF_file_icon_32x32
Examples of Singles and Multi-sensor SDD designs available from RaySpecAdobe_PDF_file_icon_32x32
Types of Single and Multi-Sensor SDD Designs available from RaySpecAdobe_PDF_file_icon_32x32